High speed, jitter-free communication (1st November 2008)

National Instruments has introduced a high-performance 8-slot chassis that delivers deterministic expansion I/O to the NI LabView graphical development platform.

From Plant process control

National Instruments expands C series family for high-performance data logging (29th April 2008)

National Instruments recently announced four new C Series modules for data-logging applications, including vibration/acoustical, in-vehicle, structural, temperature and pressure data logging...

From Newsletter Stories

  Joining up to improve interoperability (1st March 2008)

National Instruments has joined The Multicore Association, a global non-profit organisation that focuses on developing standards that help shorten time-to-market for products that involve multicore implementations.

From Plant process control

  CompactRIO systems (1st January 2008)

National Instruments has released the new NI cRIO-9072 and cRIO- 9074 CompactRIO systems that give engineers and machine builders a solution for rapidly deploying industrial machines at high volume.

From Plant process control

  Virtual instrumentation on show (1st January 2008)

National Instruments' measurement and automation hardware and software products are designed to work seamlessly together to meet the application requirements of engineers and scientists, irrespective of industry sector.

From Plant process control

Machine condition monitoring technical library from National Instruments (7th December 2007)

Machine condition monitoring can help your organisation stop unscheduled outages, optimise machine performance and reduce repair time and maintenance costs...

From Newsletter Stories

  Industrial machine control and measurement (1st September 2007)

At NIWeek 2007, National Instruments announced LabVIEW 8.5, which now brings the power of multicore, real-time processors to engineers and scientists

From Plant process control

Join the National Instruments LabVIEW Roadshow 2007 (20th August 2007)

Test-drive NI LabVIEW during hands-on sessions at 7 locations in UK & Ireland

From Newsletter Stories

Machine condition monitoring and predictive maintenance webcast series (25th June 2007)

Learn how to design your ideal machine condition monitoring system, with the help of National Instruments...

From Newsletter Stories

  USB finds its place on the factory floor (1st May 2007)

Technologies that are popular in the PC industry usually end up making their way to the factory floor.

From Plant process control

Latest catalogue (21st February 2007)

From Newsletter Stories

Latest catalogue (25th January 2007)

The measurement and automation catalogue for 2007 from National Instruments is out now...

From Newsletter Stories

Latest catalogue available (25th January 2007)

The measurement and automation catalogue for 2007 from National Instruments is out now...

From Newsletter Stories

  Simplifies design programming (1st January 2007)

National Instruments and QNX Software Systems have teamed up to extend the LabVIEW graphical dataflow environment to the QNX Neutrino real-time operating system.

Engineers can now use the NI LabVIEW Embedded Development Modu

From Plant process control

  Hundreds attend 2006 NIday (1st January 2007)

National Instruments reports that its 2006 NIday, its annual professional development conference and exhibition for engineers and scientists association with the IET, was a success when it took place in October last year.

Hu

From Plant process control

LabVIEW Real-Time and FPGA Resource Kit (22nd November 2006)

Download the NI LabVIEW Real-Time and FPGA Resource Kit to learn how National Instruments LabVIEW can quickly create deterministic control applications with hard real-time performance and reliability for mission-critical applications.

From Newsletter Stories

National Instruments New Products Brochure Volume 2 2006 (23rd October 2006)

The latest edition of the NI New Products Brochure features the latest releases from NI. Download or order your free copy today by visiting ni.com/uk and following the link in the Resources box on the right hand of the page.

From Newsletter Stories

  Grand designs (1st September 2006)

The 20th anniversary edition of Labview, the enhanced Labview 8.20, marks a new era for the programme, reports Georgina Bisby.

From Plant process control

NEW LabVIEW 8.20 20th Anniversary Edition: Easy. Powerful. Open. (23rd August 2006)

For 20 years, engineers and scientists worldwide have relied on LabVIEW graphical development throughout the product design cycle, gaining improved quality, shorter time-to-market, and greater engineering and manufacturing efficiency. Now there's a new version. Read on and take a guided tour.

From Newsletter Stories

Strategies for Building Intelligent Maintenance Systems Webcast Series (27th July 2006)

Predictive maintenance professionals who seek to improve their intelligent maintenance systems will benefit from a series of FREE web seminars from some of the industry's foremost experts. Available on demand, read the full story for seminar access.

From Newsletter Stories

Simple, complete USB data acquisition (23rd May 2006)

National Instruments sums up its new NI CompactDAQ in a handful of words: Simple. Complete. USB Data Acquisition.

From Newsletter Stories

  Modular data acquisition (1st May 2006)

National Instruments announced a new USB-based modular data acquisition system - NI CompactDAQ - a new platform ideal for sensor and electrical measurements on the benchtop, in the field and on the production line.

From Plant process control

FREE LabVIEW and data acquisition hands-on technical seminar tour (27th April 2006)

Learn how National Instruments LabVIEW graphical development platform enables you to rapidly and easily develop powerful measurement and automation applications for test, control and design. Learn how to take advantage of high performance and low cos

From Newsletter Stories

  Simplifies test data mining management (1st March 2006)

National Instruments believes the introduction of its NI DIAdem 10.0 software for inspecting, analysing and reporting test data will change the way engineers manage and mine test data.

From Plant process control

  Data acquisition device (1st January 2006)

National Instruments has introduced seven new R Series devices and five CompactRIO modules for embedded digital signal processing and high-speed control.

From Plant process control

Predictive maintenance weekly web seminars (1st January 2006)

Reliability and maintenance professionals looking to improve the consistency and cost-effectiveness of their maintenance programs can learn more about intelligent predictive maintenance strategies through a series of free web events hosted by Nationa

From In depth report

New HMIs for LabVIEW (1st December 2005)

Engineers and scientists can now use National Instruments new flat-panel touch-screen, touch-panel computer and panel PC human machine interfaces (HMIs) with the NI LabVIEW graphical development environment to develop user interfaces.

From Newsletter Stories

  New board (1st November 2005)

Engineers building machine vision systems now can trigger and synchronise multiple IEEE 1394 (FireWire) cameras without needing additional digital I/O or custom circuitry using the new National Instruments PCI-8254R image acquisition board. The board

From Production engineering

  Easy-to-use (1st September 2005)

New from National Instruments, the NI LabVIEW advanced signal processing toolkit version 7.5 is a suite of easy-to-use, palette-based tools, example programs and utilities that extends the LabVIEW graphical development environment with cutting edge m

From Plant process control

Enjoy the superior LabVIEW (1st September 2005)

After four years of engineering effort from 200 developers and 300 beta testing customers, National Instruments has launched LabVIEW 8.

From News

  Virtual reality (1st March 2005)

Low-Cost and Portable Data Acquisition: Virtual Instruments on the Factory Floor by Ian Bell, National Instruments

From Plant process control

  LabView helps save costs (1st March 2005)

Boeing has selected a National Instruments’ LabView and PXI-based solution for acquisition of vehicle launch environments on its midcourse defence system vehicle flight test program.

From Plant process control

  IMAGES AT HIGH SPEEDS (1st January 2005)

National Instruments has introduced what it says is industry’s first PCI Express-based image acquisition board for highthroughput vision applications.

From Plant process control

  STREAMLINED CATALOGUE (1st January 2005)

Described as a leading resource for engineers and scientists seeking innovative virtual instrumentation software and hardware, The Measurement and Automation Catalog 2005 is available from National Instruments.

From Plant process control

  FASTER WORK (1st July 2004)

National Instruments says engineers can execute more sophisticated image processing applications that require fast frame ranges and complex algorithms with the latest version in its Compact Vision System series.

From Plant process control

  Simplified development (1st May 2004)

A point one (.1) software release is usually not the stuff of great trumpeting. However, National Instruments new LabVIEW 7.1 Express bucks this trend and offers a significant upgrade to the family of LabVIEW graphical development products

From Plant process control

  Free CD (1st May 2004)

A National Instruments Measurement and Control Designer 2004 CD enables users to quickly select the best software and hardware for their test, measurement and industrial control applications, saving time and resources. It interfaces with an online ad

From Plant process control

  Two tool kits (1st March 2004)

National Instruments new Modulation Toolkit 2.0 and Spectral Measurements Toolkit 2.0 provide engineers with tools to perform spectrum analysis, analogue modulation and digital modulation. The kits complement the companys RF signal analyser hardware

From Plant process control

  Training day (1st January 2004)

Ian Clay, IP&Es editor attended National Instruments seminar covering Computer-Based Measurement and Automation

From Plant process control

  Tri-annual show piece (1st January 2004)

Now a fixture in the European trade show calendar IMHX 2004 promises to be a successful event.

From Handling storing

  18-slot chassis (1st January 2004)

A new software-configurable 18-slot PXI chassis from National Instruments enables engineers to programmatically configure precise timing and synchronisation signals between modular instruments. With configuration and driver software such as NI Measur

From Plant process control

HIGH SPEED LINK (1st November 2003)

Industrial process engineers can now extend plant-wide control applications to include Ethernet capabilities with the new National Instruments FBUS-HSE/H1 Fieldbus high speed Ethernet (HS) linking device. Using the linking device, engineers can fully

From News