Virtual instrumentation on show
January 1st 2008 National Instruments' measurement
and automation hardware and
software products are designed to
work seamlessly together to meet
the application requirements of
engineers and scientists,
irrespective of industry sector.
The company will show at MTEC
its latest innovations in virtual
instrumentation and graphical
system design, including LabVIEW
8.5 and recent innovations in USB
data acquisition, including a new,
low cost USB scope and DMM
products.
MTEC 2008 will also be the UK
trade show debut for the NI smart
camera family. Launched last
November, the NI 1722 and NI
1742 cameras are high
performance, low cost embedded
devices that combine an industrial
controller with an image sensor
and integrate with NI vision
software to offer image
processing directly on the
cameras, making them suitable for
applications such as locating parts,
inspecting packaging, verifying
assembly and reading 1-D and 2-D
codes.
The new cameras are shipped
with the company's Vision Builder
for Automated Inspection, an
interactive software environment for
configuring, benchmarking and
deploying machine vision
applications without programming.
The NI Smart Camera family also
features integration with NI
LabVIEW and complements the
company's range of frame
grabbers, embedded Compact
vision Systems and vision software.
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